Cite
HARVARD Citation
VU, V. et al. (2016). TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS. ECS transactions. pp. 113-119. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
VU, V. et al. (2016). TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS. ECS transactions. pp. 113-119. [Online].