`Pink'‐beam X‐ray powder diffraction profile and its use in Rietveld refinement. Issue 1 (2nd December 2020)

• Record Type: Journal Article
• Authors: Von Dreele, Robert B.; Clarke, Samantha M.; Walsh, James P. S.
• Is Part Of: Journal of applied crystallography. Volume 54:Issue 1(2021)
• Page Start: 3
• Page End: 6
• Publication Date: 2020-12-02
• Subjects: powder diffraction -- pink beams -- Rietveld refinement; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576720014624
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : The powder diffraction peak shape for a pink X‐ray beam is described and applied to Rietveld refinement. Abstract : The powder diffraction profile obtained with a pink‐beam synchrotron X‐ray source is described as the convolution of a back‐to‐back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo‐Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100 ps synchrotron X‐ray micropulse.