Cite
HARVARD Citation
Young, C. et al. (2017). (Invited) Investigation of Critical Interfaces in Few-Layer MoS2 Field Effect Transistors with High-k Dielectrics. ECS transactions. pp. 219-225. [Online].
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Young, C. et al. (2017). (Invited) Investigation of Critical Interfaces in Few-Layer MoS2 Field Effect Transistors with High-k Dielectrics. ECS transactions. pp. 219-225. [Online].