Time-Resolved Nanostructural Analysis of Catalyst Layer Formation Process by Synchrotron X-ray Scattering. (24th August 2017)

• Record Type: Journal Article
• Authors: Konosu, Yuichi; Koga, Maito; Matsumoto, Hidetoshi; Tokita, Masatoshi; Masunaga, Hiroyasu; Hikima, Takaaki; Sugimori, Hidekazu; Yoshida, Toshihiko; Shinohara, Kazuhiko; Hirai, Shuichiro
• Is Part Of: ECS transactions. Volume 80:Number 8(2017)
• Page Start: 269
• Page End: 273
• Publication Date: 2017-08-24
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/08008.0269ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : The film formation process of blade-coated catalyst ink was investigated by in-situ time-resolved grazing-incidence small-angle X-ray scattering (GISAXS) measurements utilizing synchrotron radiation. The GISAXS profiles were measured as a function of the time elapsed after coating the ink, t . As increasing t, the peak at around q z ~ 0.2 nm −1 shifted toward smaller q z . At t ~ 50 s, two peaks appeared at around q z ~ 0.5 nm −1 and then combined into one peak. These peak shifts would be ascribed to Pt/C agglomeration induced by solvent evaporation.