Improving Productivity through Reducing MBT Application Time Using Internal Bad Block Management DFT. (2nd August 2016)

• Record Type: Journal Article
• Authors: Sung, Hyun; Shim, Moon Bo; Jung, Jin Sung; Eom, Young Ik
• Is Part Of: ECS transactions. Volume 72:Number 33(2016)
• Page Start: 47
• Page End: 51
• Publication Date: 2016-08-02
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/07233.0047ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : Recently, storage market has been shifting from hard disk to SSD, and the importance of NAND flash memory, which plays a key role as a storage media in the SSD, is also increasing. Accordingly, in the manufacturing phase, the test cost of NAND flash memory is getting larger as the density of NAND flash memory is increasing. In this paper, we propose a scheme for DFT(Design for Testability) that can reduce the NAND flash test cost and apply it to the actual MBT(Monitoring Burn-in Test) manufacturing process to prove improvements in the manufacturing cost.