Effect of Silver Nanoparticles on the Electrical Characteristics of Oxide/Semiconductor Heterojunctions. (23rd April 2019)

• Record Type: Journal Article
• Authors: Rezk, Ayman; Abbas, Yawar; Saadat, Irfan; Nayfeh, Ammar; Rezeq, Moh'd
• Is Part Of: ECS transactions. Volume 89:Number 3(2019)
• Page Start: 133
• Page End: 136
• Publication Date: 2019-04-23
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/08903.0133ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : The localized electrical effect of nanoparticles present in an oxide/semiconductor hetero-junction is investigated by means of Conductive Atomic Force Microscopy (CAFM) and Scanning Kelvin Probe Microscopy (SKPM). This study demonstrates the capability of the sandwiched NPs to modulate the oxide/semiconductor junction in both forward and reverse directions, thus enabling a distinct nano-scale heterojunction. This research, in turn, will contribute to the miniaturization of such NPs based devices in novel applications.