Cite
HARVARD Citation
Larcher, L. et al. (2016). (Invited) Defect Spectroscopy and Engineering for Nanoscale Electron Device Applications: A Novel Simulation-Based Methodology. ECS transactions. pp. 167-177. [Online].
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Larcher, L. et al. (2016). (Invited) Defect Spectroscopy and Engineering for Nanoscale Electron Device Applications: A Novel Simulation-Based Methodology. ECS transactions. pp. 167-177. [Online].