Boundary Observation and Contrast Tuning of Ni/YSZ Anode by TEM and FIB-SEM. (2nd June 2015)

• Record Type: Journal Article
• Authors: Liu, Shu-Sheng; Matsumura, Syo; Koyama, Michihisa
• Is Part Of: ECS transactions. Volume 68:Number 1(2015)
• Page Start: 1275
• Page End: 1279
• Publication Date: 2015-06-02
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/06801.1275ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : Ni/yttria stabilized zirconia (Ni/YSZ) anode was investigated in the aspect of microstructure. Atomic resolution transmission electron microscopy and high resolution focused ion beam-scanning electron microscopy (FIB-SEM) were used to study the atomic structure of boundaries and phase contrast, respectively. Images of Ni/YSZ interface and Ni/YSZ/pore triple-phase boundary were obtained. High-Index contact surfaces were found. Distinct phase contrast among Ni, YSZ and resin was observed during the slice and view process in FIB-SEM.