(Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy. (13th April 2015)

• Record Type: Journal Article
• Authors: Richter, Matthias Hermann; Lichterman, Michael Frankston; Hu, Shu; Crumlin, Ethan J; Mayer, Thomas; Axnanda, S; Favaro, Marco; Drisdell, Walter; Hussain, Z; Brunschwig, Bruce; Lewis, Nathan S.; Liu, Z; Lewerenz, Hans Joachim
• Is Part Of: ECS transactions. Volume 66:Number 6(2015)
• Page Start: 105
• Page End: 113
• Publication Date: 2015-04-13
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/06606.0105ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : The energy-band relations and electronic properties for the light absorber/protection-layer stack of TiO2 -stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential ( operando ), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.