Characteristics of Naturally Textured Zn1-xMgxO Transparent Conductive Thin Film Fabricated by Sol-Gel Process. (11th May 2016)

• Record Type: Journal Article
• Authors: Meng, Lei; Miyajima, Shinsuke
• Is Part Of: ECS journal of solid state science and technology. Volume 5:Number 7(2016)
• Page Start: Q195
• Page End: Q198
• Publication Date: 2016-05-11
• Subjects: light-scattering -- sol-gel process -- transparent conductive oxide -- Zn1-xMgxO; Solid state chemistry -- Periodicals; Electronics -- Materials -- Periodicals; Electrochemistry -- Periodicals; 541.0421
• DOI: 10.1149/2.0041607jss
• Languages: English
• ISSNs: 2162-8777

Abstract

Abstract : Naturally textured Zn1-x Mgx O:Al transparent conductive thin film was developed by sol-gel process. Wrinkle-like surface morphology with different surface roughness was achieved by the nonequilibrium solute precipitation and crystallization process occurred during the drying procedure. Using solvent with large evaporation rate or increasing solute concentration enabled the formation of rough wrinkle surface morphology. It can scatter light ( λ ≤ 750 nm) stronger than the boron doped ZnO thin film with pyramidal surface morphology, which was deposited by the metallorganic chemical vapor deposition method. An AZMO thin film with slim wrinkle morphology (optical bandgap = 3.6 eV, root-mean-square roughness= 42.3 nm, and sheet resistance= 20.8 Ω/sq) was obtained.