Cite
HARVARD Citation
Li, W. et al. (2020). Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities. Materials horizons. 7 (11), pp. 2832-2859. [Online].
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Li, W. et al. (2020). Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities. Materials horizons. 7 (11), pp. 2832-2859. [Online].