Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage. (24th January 2018)

• Record Type: Journal Article
• Authors: Kaneko, Yasuko; Tokunaga, Makoto; Tanaka, Kyoko; Atsuzawa, Kimie; Nishimura, Masako
• Is Part Of: Microscopy. Volume 67:Number 2(2018)
• Page Start: 125
• Page End: 128
• Publication Date: 2018-01-24
• Subjects: BSE -- EDX -- variable accelerating voltage -- low vacuum SEM -- cryo SEM -- plant cells; Microscopy -- Periodicals; 502.825
• DOI: 10.1093/jmicro/dfx133
• Languages: English
• ISSNs: 2050-5698

Abstract

Abstract : Rapidly frozen rosemary leaves were observed at variable accelerating voltages in a low-vacuum scanning electron microscope equipped with a cryo transfer system. After water sublimation, distinct backscattered electron (BSE) images were obtained depending on the accelerating voltages applied. Furthermore, the elemental information corresponding to the BSE images was analysed. Abstract: Rapidly frozen rosemary leaves were observed at variable accelerating voltages in a low-vacuum scanning electron microscope equipped with a cryo transfer system. After water was sublimated from the fractured face of the leaf, distinct backscattered electron (BSE) images were obtained depending on the accelerating voltages applied. At 5 kV, surface cell wall structure was observed, whereas at 10 and 15 kV chloroplasts lining the inside of the cell wall and membrane were visualized. With energy dispersive X-ray microanalysis, elemental information corresponding to the BSE images was obtained. Besides visualization of the structures and elemental composition close to the living state, information on layers at different depths from the surface could be detected by varying the accelerating voltage in this system.