Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging. Issue 2 (21st December 2020)

• Record Type: Journal Article
• Authors: Farr, Nicholas T. H.; Hamad, Sameer F.; Gray, Euan; Magazzeni, Christopher M.; Longman, Fodio; Armstrong, David E. J.; Foreman, Joel P.; Claeyssens, Frederik; Green, Nicola H.; Rodenburg, Cornelia
• Is Part Of: Polymer chemistry. Volume 12:Issue 2(2021)
• Page Start: 177
• Page End: 182
• Publication Date: 2020-12-21
• Subjects: Polymers -- Periodicals; Macromolecules -- Periodicals; Polymerization -- Periodicals; 547.705
• DOI: 10.1039/d0py01220c
• Languages: English
• ISSNs: 1759-9954

Abstract

Abstract : "Secondary electron hyperspectral imaging (SEHI) is an innovative SEM-based analysis tool allowing spatially-resolved chemical analysis beyond elemental composition". Abstract : The distributions of methylene and ether bridges have been shown to impact the mechanical properties of phenolic resin. This work demonstrates the ability of the novel SEM based technique, secondary electron hyperspectral imaging (SEHI), to characterise and map methylene and ether bridges within phenolic resin at the nanoscale.