Two step synthesis of vanadium pentoxide thin films for optoelectronic applications. (2021)

• Record Type: Journal Article
• Authors: George, Amal; Raj, A. Dhayal; Irudayaraj, A. Albert; Raj, D. Magimai Antoni; Venci, X.; Jayakumar, G.; Arumugam, J.; Kumar, M. Senthil; Sundaram, S. John; Kaviyarasu, K.
• Is Part Of: Materials today. Volume 36:Part 2(2021)
• Page Start: 464
• Page End: 467
• Publication Date: 2021
• Subjects: V2O5 -- Solvothermal method -- Dip coating process -- Nanosphere -- Bandgap; Materials science -- Congresses -- Periodicals; 620.1
• DOI: 10.1016/j.matpr.2020.05.104
• Languages: English
• ISSNs: 2214-7853

Abstract

Abstract: While comparing with other materials, vanadium pentoxide nanostructures have drawn a great attentiveness due to their high stability and vast applications including solar cells, gas sensors, optoelectronic devices and so on. In this current work, V2 O5 is prepared by solvothermal synthesis at a constant temperature. The prepared vanadium pentoxide powder is again used to deposit vanadium pentoxide thin films by dip coating method. The structural, morphological and optical studies of the prepared vanadium pentoxide thin films are investigated using X-ray diffractometer (XRD), Scanning Electron Microscope (SEM) and UV–Visible Spectroscope (UV–Vis). The x-ray diffraction studies reveal that the crystallites in vanadium pentoxide film have orthorhombic structure. The appearance of nanosphere like structures on the sample surface with increasing film thickness and number of dipping is confirmed from the SEM analysis. The UV–Vis study showed that bandgap of the material is increases with increasing dipping. These studies provide a clear outlook on the properties of vanadium pentoxide thin films.