Cite
HARVARD Citation
Chen, Y. et al. (2017). Application of Impedance Spectroscopy and Surface Analysis to Obtain Oxide Film Thickness. Journal of the Electrochemical Society. 164 (9), pp. C563-C573. [Online].
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Chen, Y. et al. (2017). Application of Impedance Spectroscopy and Surface Analysis to Obtain Oxide Film Thickness. Journal of the Electrochemical Society. 164 (9), pp. C563-C573. [Online].