CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV. (December 2020)

• Record Type: Journal Article
• Authors: Falkenberg, Gerald; Seiboth, Frank; Koch, Frieder; Falch, Ken Vidar; Schropp, Andreas; Brückner, Dennis; Garrevoet, Jan
• Is Part Of: Powder diffraction. Volume 35(2020)Supplement 1
• Page Start: S34
• Page End: S37
• Publication Date: 2020-12
• Subjects: compound refractive lens, -- silicon drift detector, -- X-ray fluorescence, -- high-energy X-ray microprobe, -- synchrotron radiation, -- XRD; Powder metallurgy -- Periodicals; Materials -- Analysis -- Periodicals; 620.1127
• DOI: 10.1017/S0885715620000536
• Languages: English
• ISSNs: 0885-7156

Abstract

Abstract : A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compound refractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensor thickness for increased sensitivity at high energies. The Microprobe experiment (PETRA III) generally uses Kirkpatrick-Baez mirrors for submicrometer focusing in the energy range of 5–21 keV. However, various types of scanning X-ray microscopy experiments require higher excitation energies. The CRL optics were characterized by X-ray ptychography and X-ray fluorescence (XRF) knife edge scans on a siemens star pattern and showed beam sizes down to 110 nm. The performance of the new setup for microscopic X-ray diffraction (XRD)–XRF scanning X-ray microscopy measurements at 35 keV is demonstrated on a cross-section of a painting fragment.