Cite
HARVARD Citation
Ingerle, D. et al. (n.d.). Refitting an X-ray diffraction system for combined GIXRF and XRR measurements. Powder diffraction. pp. S29-S33. [Online].
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Ingerle, D. et al. (n.d.). Refitting an X-ray diffraction system for combined GIXRF and XRR measurements. Powder diffraction. pp. S29-S33. [Online].