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HARVARD Citation
Tengeler, S. et al. (2018). Erratum: The Impact of Different Si Surface Terminations in the (001) n-Si/NiOx Heterojunction on the Oxygen Evolution Reaction (OER) by XPS and Electrochemical Methods [J. Electrochem. Soc., 165, H3122 (2018)]. Journal of the Electrochemical Society. 165 (2), p. X2. [Online].