Structure dependence of microwave dielectric properties in Zn2-xSiO4-x-xCuO ceramics. Issue 4 (April 2021)

• Record Type: Journal Article
• Authors: Lai, Yuanming; Zeng, Yiming; Han, Jiao; Liang, Xiaofeng; Zhong, Xiaoling; Liu, Mingzhe; Duo, Bin; Su, Hua
• Is Part Of: Journal of the European Ceramic Society. Volume 41:Issue 4(2021)
• Page Start: 2602
• Page End: 2609
• Publication Date: 2021-04
• Subjects: Zn2SiO4 ceramic -- Microwave dielectric properties -- Crystal structure -- Complex chemical bond theory; Ceramic materials -- Periodicals; Composite materials -- Periodicals; Matériaux céramiques -- Périodiques; Composites -- Périodiques; Ceramic materials; Composite materials; Periodicals; Electronic journals; 666.05
• DOI: 10.1016/j.jeurceramsoc.2020.12.013
• Languages: English
• ISSNs: 0955-2219

Abstract

Abstract: In this work, the Zn2- x SiO4- x - x CuO ( x = 0, 0.04, 0.08, 0.12, 0.16 and 0.20) ceramics were synthesized through solid state reaction. The dependence of microwave dielectric properties on the structure was investigated through X-ray diffraction (XRD) with Rietveld refinements, Scanning electron microscope (SEM) and Raman spectra. The melting of CuO can reduce the densification temperature of Zn2- x SiO4- x ceramics. In comparison with x = 0, the x = 0.08 ceramics were densified at 1150℃ and the excellent microwave dielectric properties with low dielectric constant (εr = 6.01), high quality factor (Qf = 105 500 GHz) and τf = −28 ppm/°C, were obtained. The εr, Qf and τf value are dominated by covalency of Si-O bond and secondary phase, crystallinity and lattice energy, respectively. This provides a theoretical basis to further adjust the microwave dielectric property (especially τf value) from the structural point of view.