Enhancement of Seeding and Electroless Cu Plating on TaN Barrier Layers: The Role of Plasma Functionalized Self-Assembled Monolayers. Issue 9 (24th June 2016)
- Record Type:
- Journal Article
- Title:
- Enhancement of Seeding and Electroless Cu Plating on TaN Barrier Layers: The Role of Plasma Functionalized Self-Assembled Monolayers. Issue 9 (24th June 2016)
- Main Title:
- Enhancement of Seeding and Electroless Cu Plating on TaN Barrier Layers: The Role of Plasma Functionalized Self-Assembled Monolayers
- Authors:
- Chen, Giin-Shan
Wu, Ding-Ye
Chen, Sung-Te
Cheng, Yi-Lung
Fang, Jau-Shiung
Yang, Tzu-Ming - Abstract:
- Abstract : Self-assembled monolayers (SAMs) are extensively used in microelectronic copper metallization primarily as seed-trapping layers, diffusion barriers, or pore-sealants for porous dielectric materials. However, direct electroless copper plating of nitride barrier layers assisted by a seed-trapping SAM is rarely examined. Therefore, this work uses TaN, a standard barrier material for Cu metallization, as a model substrate to develop a new seeding (catalyst formation) process for electroless copper plating, involving substrate pretreatments from piranha etching (hydroxylation), octadecyltrichlorosilane SAM (OTS-SAM) deposition and subsequent functionalization. Catalytic particles upon adsorption onto piranha-treated (reference) TaN layers via Ta−OH linkages tend to agglomerate to give a limited density of 8 × 10 13 m −2 . In contrast, those adsorbed on piranha-treated TaN layers with a plasma-functionalized OTS-SAM over-coating are free from agglomeration and remain an average size of only 3 nm, along with an elevated density of 1 × 10 15 m −2 . X-ray photoelectron spectroscopy, together with transmission electron microscopy, clearly identifies the thin-film materials deposited and functional groups induced by each of the pretreatments, allowing the mechanism of seeding enhancement to be clarified. Finally, the enhancement of seeding to benefit electroless copper plating will be demonstrated.
- Is Part Of:
- Journal of the Electrochemical Society. Volume 163:Issue 9(2016)
- Journal:
- Journal of the Electrochemical Society
- Issue:
- Volume 163:Issue 9(2016)
- Issue Display:
- Volume 163, Issue 9 (2016)
- Year:
- 2016
- Volume:
- 163
- Issue:
- 9
- Issue Sort Value:
- 2016-0163-0009-0000
- Page Start:
- D463
- Page End:
- D468
- Publication Date:
- 2016-06-24
- Subjects:
- Electroless plating -- Seeding -- Self-assembled monolayer (SAM) -- TaN barrier layer
Electrochemistry -- Periodicals
541.3705 - Journal URLs:
- https://iopscience.iop.org/journal/1945-7111?gclid=EAIaIQobChMI4Y-UmqGC7wIVFeDtCh0VQAo7EAAYASAAEgLW8_D_BwE ↗
- DOI:
- 10.1149/2.0131609jes ↗
- Languages:
- English
- ISSNs:
- 0013-4651
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 15524.xml