Cite
HARVARD Citation
Pandey, C. et al. (2018). Impact of Dielectric Pocket on Analog and High-Frequency Performances of Cylindrical Gate-All-Around Tunnel FETs. ECS journal of solid state science and technology. pp. N59-N66. [Online].
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Pandey, C. et al. (2018). Impact of Dielectric Pocket on Analog and High-Frequency Performances of Cylindrical Gate-All-Around Tunnel FETs. ECS journal of solid state science and technology. pp. N59-N66. [Online].