Cite
HARVARD Citation
Kolomiiets, N. et al. (2016). Valence Band Profile in Two-Dimensional Silicon-Oxygen Superlattices Probed by Internal Photoemission. ECS journal of solid state science and technology. pp. Q3008-Q3011. [Online].
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Kolomiiets, N. et al. (2016). Valence Band Profile in Two-Dimensional Silicon-Oxygen Superlattices Probed by Internal Photoemission. ECS journal of solid state science and technology. pp. Q3008-Q3011. [Online].