Ultrathin Supported Lipid Monolayer with Unprecedented Mechanical and Dielectric Properties. (21st May 2018)

• Record Type: Journal Article
• Authors: Kenaan, Ahmad; El Zein, Racha; Kilinc, Volkan; Lamant, Sébastien; Raimundo, Jean‐Manuel; Charrier, Anne M.
• Is Part Of: Advanced functional materials. Volume 28:Number 28(2018)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2018-05-21
• Subjects: dielectric properties -- lipid engineering -- mechanical properties -- supported lipid monolayer -- ultrathin dielectric materias; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adfm.201801024
• Languages: English
• ISSNs: 1616-301X

Abstract

Abstract: The development of ultrathin dielectrics for low power electronics operations, flexible and printed electronics, and field‐effect‐transistor‐based sensors is still a challenge. Here, monolayers of engineered lipids supported on silicon are reported presenting exceptional mechanical and dielectric properties. The lipid monolayers are stabilized using a simple procedure based on a two‐stage reticulation process in both their aliphatic chains and their head‐group. With a thickness lower than 3 nm, such layers are demonstrated to offer exceptional mechanical and dielectric stability with unprecedented low leakage current and dielectric strength. Surprisingly, the mechanical and dielectric pressures required to rupture/breakdown the monolayers are shown to be similar. These results suggest the presence of a strong correlation between mechanical and dielectric properties, as well as between the mechanisms of rupture and breakdown. Abstract : The development of ultrathin engineered lipid monolayers with exceptional mechanical and dielectric properties to be used as ultrathin dielectric is reported. The layers are obtained by a simple two‐stage reticulation process. A relationship between mechanical and dielectric performances is demonstrated.