The five‐analyzer point‐to‐point scanning crystal spectrometer at ESRF ID26. (18th December 2020)

• Record Type: Journal Article
• Authors: Glatzel, Pieter; Harris, Alistair; Marion, Philippe; Sikora, Marcin; Weng, Tsu-Chien; Guilloud, Cyril; Lafuerza, Sara; Rovezzi, Mauro; Detlefs, Blanka; Ducotté, Ludovic
• Is Part Of: Journal of synchrotron radiation. Volume 28:Part 1(2021)
• Page Start: 362
• Page End: 371
• Publication Date: 2020-12-18
• Subjects: X‐ray emission spectrometers -- crystal analyzers -- Rowland circle -- Johann geometry; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577520015416
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : The design of a multi‐crystal Johann‐type spectrometer for X‐ray emission spectroscopy is presented. Fundamental concepts and alignment procedure are described. Abstract : X‐ray emission spectroscopy in a point‐to‐point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray‐tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.