First-principles calculations of Stark shifts of electronic transitions for defects in semiconductors: the Si vacancy in 4H-SiC. (23rd November 2020)
- Record Type:
- Journal Article
- Title:
- First-principles calculations of Stark shifts of electronic transitions for defects in semiconductors: the Si vacancy in 4H-SiC. (23rd November 2020)
- Main Title:
- First-principles calculations of Stark shifts of electronic transitions for defects in semiconductors: the Si vacancy in 4H-SiC
- Authors:
- Bathen, Marianne Etzelmüller
Vines, Lasse
Coutinho, José - Abstract:
- Abstract: Point defects in solids are promising single-photon sources with application in quantum sensing, computing and communication. Herein, we describe a theoretical framework for studying electric field effects on defect-related electronic transitions, based on density functional theory calculations with periodic boundary conditions. Sawtooth-shaped electric fields are applied perpendicular to the surface of a two-dimensional defective slab, with induced charge singularities being placed in the vacuum layer. The silicon vacancy ( V Si ) in 4H-SiC is employed as a benchmark system, having three zero-phonon lines in the near-infrared (V1, V1′ and V2) and exhibiting Stark tunability via fabrication of Schottky barrier or p-i-n diodes. In agreement with experimental observations, we find an approximately linear field response for the zero-phonon transitions of V Si involving the decay from the first excited state (named V1 and V2). However, the magnitude of the Stark shifts are overestimated by nearly a factor of 10 when comparing to experimental findings. We discuss several theoretical and experimental aspects which could affect the agreement.
- Is Part Of:
- Journal of physics. Volume 33:Number 7(2021)
- Journal:
- Journal of physics
- Issue:
- Volume 33:Number 7(2021)
- Issue Display:
- Volume 33, Issue 7 (2021)
- Year:
- 2021
- Volume:
- 33
- Issue:
- 7
- Issue Sort Value:
- 2021-0033-0007-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-11-23
- Subjects:
- silicon carbide -- first-principles calculations -- Stark effect -- single-photon emission -- silicon vacancy -- point defects
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530.4105 - Journal URLs:
- http://www.iop.org/Journals/cm ↗
http://iopscience.iop.org/0953-8984/ ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-648X/abc804 ↗
- Languages:
- English
- ISSNs:
- 0953-8984
- Deposit Type:
- Legaldeposit
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- Available online (eLD content is only available in our Reading Rooms) ↗
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- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 15282.xml