2D Materials: Probing Effective Out‐of‐Plane Piezoelectricity in van der Waals Layered Materials Induced by Flexoelectricity (Small 46/2019). Issue 46 (13th November 2019)

• Record Type: Journal Article
• Authors: Wang, Xiang; Cui, Anyang; Chen, Fangfang; Xu, Liping; Hu, Zhigao; Jiang, Kai; Shang, Liyan; Chu, Junhao
• Is Part Of: Small. Volume 15:Issue 46(2019)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2019-11-13
• Subjects: flexoelectric effect -- InSe -- MoS2 -- piezoelectricity -- piezoresponse force microscopy; Nanotechnology -- Periodicals; Nanoparticles -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1002/smll.201970250
• Languages: English
• ISSNs: 1613-6810

Abstract

Abstract : The piezoelectric property of van der Waals materials is difficult to be collected and quantified experimentally. In article number 1903106, Zhigao Hu and co‐workers present an efficient scanning probe method to quantify the effective out‐of‐plane electromechanical coupling response on 2D layered materials including MoS2 and InSe by a free‐standing designation.