PM-10Evaluation of Atomic Position Precision in Electrical Biasing In-situ Scanning Transmission Electron Microscopy Observation. (14th November 2017)

Record Type:: Journal Article
Title:: PM-10Evaluation of Atomic Position Precision in Electrical Biasing In-situ Scanning Transmission Electron Microscopy Observation. (14th November 2017)
Main Title:: PM-10Evaluation of Atomic Position Precision in Electrical Biasing In-situ Scanning Transmission Electron Microscopy Observation
Authors:: Sato, Yukio
Gondo, Takashi
Miyazaki, Hiroya
Teranishi, Ryo
Kaneko, Kenji
Abstract:
Is Part Of:: Microscopy. Volume 66(2017)Supplement 1
Journal:: Microscopy
Issue:: Volume 66(2017)Supplement 1
Issue Display:: Volume 66, Issue 1 (2017)
Year:: 2017
Volume:: 66
Issue:: 1
Issue Sort Value:: 2017-0066-0001-0000
Page Start:: i22
Page End:: i22
Publication Date:: 2017-11-14
Subjects:: Microscopy -- Periodicals
502.825
Journal URLs:: http://jmicro.oxfordjournals.org/ ↗
http://ukcatalogue.oup.com/ ↗
DOI:: 10.1093/jmicro/dfx065 ↗
Languages:: English
ISSNs:: 2050-5698
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 15258.xml