Development of on-chip pattern processing in event-driven SOI pixel detector for X-ray astronomy with background rejection purpose. (1st December 2020)

Record Type:
Journal Article
Title:
Development of on-chip pattern processing in event-driven SOI pixel detector for X-ray astronomy with background rejection purpose. (1st December 2020)
Main Title:
Development of on-chip pattern processing in event-driven SOI pixel detector for X-ray astronomy with background rejection purpose
Authors:
Takeda, A.
Mori, K.
Nishioka, Y.
Hida, T.
Yukumoto, M.
Kanemaru, Y.
Yonemura, S.
Mieda, K.
Tsuru, T. G.
Tanaka, T.
Kurachi, I.
Arai, Y.
Abstract:
Is Part Of:
Journal of instrumentation. Volume 15:Number 12(2020)
Journal:
Journal of instrumentation
Issue:
Volume 15:Number 12(2020)
Issue Display:
Volume 15, Issue 12 (2020)
Year:
2020
Volume:
15
Issue:
12
Issue Sort Value:
2020-0015-0012-0000
Page Start:
P12025
Page End:
P12025
Publication Date:
2020-12-01
Subjects:
Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:
http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:
10.1088/1748-0221/15/12/P12025 ↗
Languages:
English
ISSNs:
1748-0221
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
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Ingest File:
15250.xml