10‐3: High Refractive Index Glass Wafers for Augmented Reality Devices using Waveguide Technology: Recent Advances in Control of Quality Parameters and their Correlation with Device Properties. Issue 1 (29th May 2019)

• Record Type: Journal Article
• Authors: Sprengard, Ruediger; Sjogren, Brian; Nass, Peter; Ottermann, Clemens; Lange, Berthold; Damm, Thorsten; Plapper, Volker; Dietrich, Volker; Maurer, Ulrich; Fang, Helen; Weng, Nicolas; Wang, Alex; Apitz, Dirk; Brauneck, Ulf; Wyrowski, F.; Hellmann, C.; Crailsheim, H.
• Is Part Of: Digest of technical papers. Volume 50:Issue 1(2019)
• Page Start: 116
• Page End: 120
• Publication Date: 2019-05-29
• Subjects: Augmented Reality -- Mixed Reality -- Waveguide -- Light guide -- Image guide -- Glass Wafer -- Substrate -- Refractive Index -- High Index -- Total Thickness Variation; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.12869
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : Waveguide Technology is widely believed to constitute one of the most promising approaches to realize affordable Augmented Reality (AR) / Mixed Reality (MR) devices combining smallest form‐factor with uncompromised image quality allowing for full immersion user experience. Optical waveguides are made from special grade glass wafers. The characteristics of such wafers are directly determining image properties, such as Field‐of‐View, contrast, brightness, distortion of the image projected into the user's eye and many more. We are reporting latest advances in measuring and controlling key quality parameters with focus on total thickness variation, optical homogeneity and thickness tolerance of the wafers. We discuss the impact of these parameters on image quality using optical modelling of the waveguides.