Voltage bias stress effects in metal halide perovskites are strongly dependent on morphology and ion migration pathways. Issue 47 (26th November 2020)

• Record Type: Journal Article
• Authors: Flannery, Laura; Ogle, Jonathan; Powell, Daniel; Tassone, Christopher; Whittaker-Brooks, Luisa
• Is Part Of: Journal of materials chemistry. Volume 8:Issue 47(2020)
• Page Start: 25109
• Page End: 25119
• Publication Date: 2020-11-26
• Subjects: Materials -- Research -- Periodicals; Chemistry, Analytic -- Periodicals; Environmental sciences -- Research -- Periodicals; 543.0284
• DOI: 10.1039/d0ta10371c
• Languages: English
• ISSNs: 2050-7488

Abstract

Abstract : We determined how morphology, electronic and interfacial interactions affect perovskite PVs under voltage bias stress. Our findings provide insights into the discrepancies in the solar cell efficiencies observed across many different research groups. Abstract : The solar-to-power power conversion efficiencies (PCEs) of metal halide perovskites (MHP) have improved over the last decade using a wide variety of methods, including composition manipulation, dopant introduction, and interfacial buffers. These methods, however, have taken little regard for the electronic and interfacial effects such alterations may cause within devices under voltage bias stress – a condition required for most device operation. We investigate how halide and cation substitution in MHP structures [specifically, CH3 NH3 PbI2.87 Cl0.13 and Cs0.1 (MA0.17 FA0.83 )0.9 Pb(I0.83 Br0.17 )3 ] effects the current behavior of devices while under a range of voltage bias stress in both light and dark conditions. Conducting in depth investigations into the electronic and morphological differences between these two MHP devices, we confirmed their unique voltage bias stress effects are due to intrinsic behavior within the perovskite structure. Importantly, we also determined how crystallite orientation can influence ion migration and therefore alter charge transport and current stability in MHP photovoltaic devices.