Characterizing the Back-Contact Interface for CdTe PV through HRSTEM, EELS, and XEDS. (August 2020)

Record Type:: Journal Article
Title:: Characterizing the Back-Contact Interface for CdTe PV through HRSTEM, EELS, and XEDS. (August 2020)
Main Title:: Characterizing the Back-Contact Interface for CdTe PV through HRSTEM, EELS, and XEDS
Authors:: Farrell, John
Guo, Jinglong
Sites, James
Sampath, W.S.
Klie, Robert
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 26:(2020)Supplement 2
Journal:: Microscopy and microanalysis
Issue:: Volume 26:(2020)Supplement 2
Issue Display:: Volume 26, Issue 2 (2020)
Year:: 2020
Volume:: 26
Issue:: 2
Issue Sort Value:: 2020-0026-0002-0000
Page Start:: 156
Page End:: 158
Publication Date:: 2020-08
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S1431927620013616 ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
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Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 15180.xml