Cite
HARVARD Citation
Güsken, N. et al. (2020). IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. MRS advances. pp. 1843-1850. [Online].
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Güsken, N. et al. (2020). IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions. MRS advances. pp. 1843-1850. [Online].