Facility and the method for MEIS analysis of layers redeposited in plasma devices. (September 2016)
- Record Type:
- Journal Article
- Title:
- Facility and the method for MEIS analysis of layers redeposited in plasma devices. (September 2016)
- Main Title:
- Facility and the method for MEIS analysis of layers redeposited in plasma devices
- Authors:
- Bulgadaryan, D
Kolodko, D
Kurnaev, V
Sinelnikov, D - Abstract:
- Abstract: The experimental facility for surface analysis by means of middle energy ion scattering (MEIS) is described. Experimental results are compared with SCATTER computer code simulation. The simulation shows the possibility to determine the thickness of very thin redeposited layers of heavy elements by keV energy hydrogen ions scattering spectroscopy.
- Is Part Of:
- Journal of physics. Volume 748(2016)
- Journal:
- Journal of physics
- Issue:
- Volume 748(2016)
- Issue Display:
- Volume 748, Issue 1 (2016)
- Year:
- 2016
- Volume:
- 748
- Issue:
- 1
- Issue Sort Value:
- 2016-0748-0001-0000
- Page Start:
- Page End:
- Publication Date:
- 2016-09
- Subjects:
- Physics -- Congresses
530.5 - Journal URLs:
- http://www.iop.org/EJ/journal/1742-6596 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1742-6596/748/1/012016 ↗
- Languages:
- English
- ISSNs:
- 1742-6588
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5036.223000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 15097.xml