Measurement of L subshell fluorescence yield ratios of some high Z elements by selective excitation method. (7th September 2020)

• Record Type: Journal Article
• Authors: Hiremath, G. B.; Bennal, A. S.; Hosamani, M. M.; Badiger, N. M.; Trivedi, A.; Tiwari, M. K.
• Is Part Of: X-ray spectrometry. Volume 50:Number 1(2021)
• Page Start: 37
• Page End: 44
• Publication Date: 2020-09-07
• Subjects: X-ray spectroscopy -- Periodicals; 543.62
• DOI: 10.1002/xrs.3191
• Languages: English
• ISSNs: 0049-8246

Abstract

Abstract : The L1, L2 and L3 subshells of Hf, Ta and Re atoms have been excited selectively by using microprobe XRF beam line, Indus‐2, RRCAT, India. The consequent characteristic L X‐ray photons, emitted from the targets due to creations of vacancies in L subshells, are measured using silicon drift detector (X‐123) spectrometer. As the energy of synchrotron radiation increases, the contribution of characteristic L X‐ray intensity increases. The advantage of the increase in the intensity of the characteristic L X‐ray photons with an increase in the energy of synchrotron radiation has been used to determine the L subshell fluorescence yield ratios of Hf, Ta and Re atoms by adopting the selective excitation method. The measured ratios of L subshell fluorescence yield have been compared with theoretical and other experimental values.