Certification of SRM 640f line position and line shape standard for powder diffraction. Issue 3 (September 2020)

• Record Type: Journal Article
• Authors: Black, David R.; Mendenhall, Marcus H.; Henins, Albert; Filliben, James; Cline, James P.
• Is Part Of: Powder diffraction. Volume 35:Issue 3(2020)
• Page Start: 156
• Page End: 159
• Publication Date: 2020-09
• Subjects: certification, -- diffractometer, -- lattice parameter, -- Standard Reference Material, -- X-ray diffraction; Powder metallurgy -- Periodicals; Materials -- Analysis -- Periodicals; 620.1127
• DOI: 10.1017/S0885715620000366
• Languages: English
• ISSNs: 0885-7156

Abstract

Abstract : The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 640f, the seventh generation of this powder diffraction SRM, which is designed to be used primarily for calibrating powder diffractometers with respect to line position; it also can be used for the determination of the instrument profile function. It is certified with respect to the lattice parameter and consists of approximately 7.5 g of silicon powder prepared to minimize line broadening. A NIST-built diffractometer, incorporating many advanced design features, was used to certify the lattice parameter of the Si powder. Both statistical and systematic uncertainties have been assigned to yield a certified value for the lattice parameter at 22.5 °C of a = 0.5431144 ± 0.000008 nm.