Cross‐sectional structural characterization of the surface of exfoliated HOPG using HRTEM‐EELS. (1st September 2020)

• Record Type: Journal Article
• Authors: Miyazawa, Kun'ichi; Nagai, Takuro; Kimoto, Koji; Yoshitake, Masaru; Tanaka, Yumi
• Is Part Of: Surface and interface analysis. Volume 53:Number 1(2021)
• Page Start: 84
• Page End: 89
• Publication Date: 2020-09-01
• Subjects: EELS -- exfoliation -- graphene -- HOPG -- HRTEM -- STEM; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.6875
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : We analyzed the surface atomic structure of highly oriented pyrolytic graphite (HOPG) substrate exfoliated with adhesive tape, using high‐resolution transmission electron microscopy and scanning transmission electron microscopy‐electron energy‐loss spectroscopy (STEM‐EELS). The surface step height of the exfoliated HOPG substrate was determined using high‐angle annular dark‐field‐scanning transmission electron microscopy (HAADF‐STEM) images and the depth profiles of the EELS spectra of a cross‐sectioned thin foil specimen prepared via focused ion beam milling. The exfoliated surface of the HOPG substrate presented disordered and curved graphene layers. The STEM‐EELS measurements indicated that upon exfoliation, the surface of the HOPG substrate reacted with atmospheric water and oxygen molecules.