AFM investigation and optical band gap study of chemically deposited PbS thin films. (August 2016)

• Record Type: Journal Article
• Authors: Zaman, S.; Mansoor, M.; Abubakar, ; Asim, M. M.
• Is Part Of: IOP conference series. Volume 146(2016)
• Publication Date: 2016-08
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/146/1/012034
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: The interest into deposition of nanocrystalline PbS thin films, the potential of designing and tailoring both the topographical features and the band gap energy (Eg) by controlling growth parameters, has significant technological importance. Nanocrystalline thin films of lead sulfide were grown onto glass substrates by chemical bath deposition (CBD) method. The experiments were carried out by varying deposition temperature. We report on the modification of structural and optical properties as a function of deposition temperature. The morphological changes of the films were analyzed by using SEM and AFM. AFM was also used to calculate average roughness of the films. XRD spectra indicated preferred growth of cubic phase of PbS films in (200) direction with increasing deposition time. Optical properties have been studied by UV-Spectrophotometer. From the diffused reflectance spectra we have calculated the optical Eg shift from 0.649-0.636 eV with increasing deposition time.