A Novel Atomic Force Microscope with Multi-Mode Scanner. (January 2016)

• Record Type: Journal Article
• Authors: Qin, Chun; Zhang, Haijun; Xu, Rui; Han, Xu; Wang, Shuying
• Is Part Of: Journal of physics. Volume 680(2016)
• Publication Date: 2016-01
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/680/1/012009
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: A new type of atomic force microscope (AFM) with multi-mode scanner is proposed. The AFM system provides more than four scanning modes using a specially designed scanner with three tube piezoelectric ceramics and three stack piezoelectric ceramics. Sample scanning of small range with high resolution can be realized by using tube piezos, meanwhile, large range scanning can be achieved by stack piezos. Furthermore, the combination with tube piezos and stack piezos not only realizes high-resolution scanning of small samples with large- scale fluctuation structure, but also achieves small range area-selecting scanning. Corresponding experiments are carried out in terms of four different scanning modes showing that the AFM is of reliable stability, high resolution and can be widely applied in the fields of micro/nano-technology.