Cite
HARVARD Citation
Gardener, J. et al. (n.d.). Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy Experiments: Use Carbon for Now. Microscopy and microanalysis. pp. 3202-3203. [Online].
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Gardener, J. et al. (n.d.). Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy Experiments: Use Carbon for Now. Microscopy and microanalysis. pp. 3202-3203. [Online].