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Zhao, W. et al. (n.d.). Challenges in Characterizations of MTJ Thin Film Stack for Spin-transfer Torque MRAM Device by Analytical TEM in Wafer-foundries. Microscopy and microanalysis. pp. 2820-2821. [Online].
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Zhao, W. et al. (n.d.). Challenges in Characterizations of MTJ Thin Film Stack for Spin-transfer Torque MRAM Device by Analytical TEM in Wafer-foundries. Microscopy and microanalysis. pp. 2820-2821. [Online].