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Spurgeon, S. et al. (n.d.). Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. Microscopy and microanalysis. pp. 2822-2823. [Online].
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Spurgeon, S. et al. (n.d.). Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. Microscopy and microanalysis. pp. 2822-2823. [Online].