Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs. (August 2020) - Spurgeon, Steven; Matthews, Bethany; Sushko, Peter; Linpeng, Xiayu; Viitaniemi, Maria; Durnev, Mikhail; Glazov, Mikhail; Wieck, Andreas; Ludwig, Arne; Fu, Kai-Mei