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HARVARD Citation
Jung, H. et al. (n.d.). In-situ Observation of Out-of-plane Switching Filament in 2D Halide (PbI2)1-x(BiI3)x Memristor Under Operando Biasing. Microscopy and microanalysis. pp. 848-849. [Online].
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Jung, H. et al. (n.d.). In-situ Observation of Out-of-plane Switching Filament in 2D Halide (PbI2)1-x(BiI3)x Memristor Under Operando Biasing. Microscopy and microanalysis. pp. 848-849. [Online].