Cite
HARVARD Citation
Sun, L. et al. (2020). Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature. Applied physics express. p. . [Online].
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Sun, L. et al. (2020). Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature. Applied physics express. p. . [Online].