Evaluation of radiation hardness of High-Voltage silicon vertical JFETs. (1st November 2020)

Record Type:: Journal Article
Title:: Evaluation of radiation hardness of High-Voltage silicon vertical JFETs. (1st November 2020)
Main Title:: Evaluation of radiation hardness of High-Voltage silicon vertical JFETs
Authors:: Giacomini, G.
Bomben, M.
Chen, W.
Lynn, D.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 15:Number 11(2020)
Journal:: Journal of instrumentation
Issue:: Volume 15:Number 11(2020)
Issue Display:: Volume 15, Issue 11 (2020)
Year:: 2020
Volume:: 15
Issue:: 11
Issue Sort Value:: 2020-0015-0011-0000
Page Start:: T11001
Page End:: T11001
Publication Date:: 2020-11-01
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/15/11/T11001 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14966.xml