Cite
HARVARD Citation
Wang, B. et al. (2020). Deep level defects and their instability in PLD-grown IGZO (In2Ga2Zn5O11) thin films studied by thermally stimulated current spectroscopy. Semiconductor science and technology. p. . [Online].
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Wang, B. et al. (2020). Deep level defects and their instability in PLD-grown IGZO (In2Ga2Zn5O11) thin films studied by thermally stimulated current spectroscopy. Semiconductor science and technology. p. . [Online].