Cite
HARVARD Citation
Raut, M. et al. (2020). Characterization of high-purity germanium (Ge) crystals for developing novel Ge detectors. Journal of instrumentation. p. T10010. [Online].
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Raut, M. et al. (2020). Characterization of high-purity germanium (Ge) crystals for developing novel Ge detectors. Journal of instrumentation. p. T10010. [Online].