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HARVARD Citation
Nagatomi, T. et al. (2020). Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopy. Microscopy. pp. 11-16. [Online].
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Nagatomi, T. et al. (2020). Application of focused ion-beam sampling for sidewall-roughness measurement of free-standing sub-μm objects by atomic force microscopy. Microscopy. pp. 11-16. [Online].