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HARVARD Citation
Goller, M. et al. (2020). Investigation of the current collapse behaviour in GaN power HEMTs with highly adjustable pulse and measurement concept. Microelectronics and reliability. p. . [Online].
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Goller, M. et al. (2020). Investigation of the current collapse behaviour in GaN power HEMTs with highly adjustable pulse and measurement concept. Microelectronics and reliability. p. . [Online].