Cite
HARVARD Citation
Du, H. et al. (2020). Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis. Microelectronics and reliability. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Du, H. et al. (2020). Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis. Microelectronics and reliability. p. . [Online].